Solutions Virtual Conference - Session 19

Solutions Virtual Conference - Session 19

RAP Talk:


IIoT: Good Data, Bad Data, Required Data

by Dave Reiber, Independent Business Consultant at Reiber Reliability LLC

The Industrial Internet of Things (IIoT), has changed how we gather, refine and use the information from our assets. What does good data look like? What is meaningful data, that can be trended and patterned to help us make faster & better business decisions?

Educational Session:

Is Accelerated Life Testing Right for My Products?
by Mike Nelson, Manager of Reliability Engineering at Underwriters Laboratories

Life testing has been an important final step in the product development process. This presentation will identify alternatives for accelerating product life testing and will highlight the benefits and cons for each testing method.