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Leveraging 5G-IoT-MEC And Ai To Mitigate Infant Mortality And Drive To Zero Defects

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Leveraging 5G-IoT-MEC And Ai To Mitigate Infant Mortality And Drive To Zero Defectsplay icon

MaximoWorld Presentation (46:57)

Marc Bulandr, Verizon and Ed Neubecker-registered, IBM

Rapid identification of defects in the manufacturing process is central to driving increased uptime and reliability of assets in the manufacturing process. IBM and Verizon have a demonstrable solution and POV that will reduce downtime & infant mortality through proven AI, 5G & wireless use cases.

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